Automated method for determining the etch pits density on crystallographic planes of large semiconductor crystals

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Bibliographic Details
Date:2016
Main Authors: G. S. Pekar, A. A. Singaevsky, A. F. Singaevsky
Format: Article
Language:English
Published: 2016
Series:Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000714528
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Journal Title:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS