Ievtukh, V. A., Ulyanov, V. V., & Nazarov, A. N. (2016). The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures.
Chicago Style (17th ed.) CitationIevtukh, V. A., V. V. Ulyanov, and A. N. Nazarov. The Charge Trapping/emission Processes in Silicon Nanocrystalline Nonvolatile Memory Assisted by Electric Field and Elevated Temperatures. 2016.
MLA (8th ed.) CitationIevtukh, V. A., et al. The Charge Trapping/emission Processes in Silicon Nanocrystalline Nonvolatile Memory Assisted by Electric Field and Elevated Temperatures. 2016.
Warning: These citations may not always be 100% accurate.