Ievtukh, V. A., Ulyanov, V. V., & Nazarov, A. N. (2016). The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures.
Chicago-Zitierstil (17. Ausg.)Ievtukh, V. A., V. V. Ulyanov, und A. N. Nazarov. The Charge Trapping/emission Processes in Silicon Nanocrystalline Nonvolatile Memory Assisted by Electric Field and Elevated Temperatures. 2016.
MLA-Zitierstil (8. Ausg.)Ievtukh, V. A., et al. The Charge Trapping/emission Processes in Silicon Nanocrystalline Nonvolatile Memory Assisted by Electric Field and Elevated Temperatures. 2016.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.