Стиль цитування APA (7-ме видання)

Ievtukh, V. A., Ulyanov, V. V., & Nazarov, A. N. (2016). The charge trapping/emission processes in silicon nanocrystalline nonvolatile memory assisted by electric field and elevated temperatures.

Чикаго стиль цитування (17-те видання)

Ievtukh, V. A., V. V. Ulyanov, та A. N. Nazarov. The Charge Trapping/emission Processes in Silicon Nanocrystalline Nonvolatile Memory Assisted by Electric Field and Elevated Temperatures. 2016.

Стиль цитування MLA (8-ме видання)

Ievtukh, V. A., et al. The Charge Trapping/emission Processes in Silicon Nanocrystalline Nonvolatile Memory Assisted by Electric Field and Elevated Temperatures. 2016.