Voitovych, V. V., Rudenko, R. M., Yukhymchuk, V. O., Voitovych, M. V., Krasko, M. M., Kolosiuk, A. H., . . . Rudenko, M. P. (2016). Effect of tin on structural transformations in the thin-film silicon suboxide matrix.
Chicago Style (17th ed.) CitationVoitovych, V. V., R. M. Rudenko, V. O. Yukhymchuk, M. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, Yu Povarchuk, I. M. Khatsevych, and M. P. Rudenko. Effect of Tin on Structural Transformations in the Thin-film Silicon Suboxide Matrix. 2016.
MLA (8th ed.) CitationVoitovych, V. V., et al. Effect of Tin on Structural Transformations in the Thin-film Silicon Suboxide Matrix. 2016.
Warning: These citations may not always be 100% accurate.