$Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry$

Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry

Збережено в:

Бібліографічні деталі
Дата:	2016
Автор:	V. P. Shafranyuk
Формат:	Стаття
Мова:	English
Опубліковано:	2016
Назва видання:	Journal of thermoelectricity
Онлайн доступ:	http://jnas.nbuv.gov.ua/article/UJRN-0000734006
Теги:	Додати тег Немає тегів, Будьте першим, хто поставить тег для цього запису!
Назва журналу:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

Репозитарії

Library portal of National Academy of Sciences of Ukraine | LibNAS

id	open-sciencenbuvgovua-52596
record_format	dspace
spelling	open-sciencenbuvgovua-525962024-02-29T13:07:30Z Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry V. P. Shafranyuk 1607-8829 2016 en Journal of thermoelectricity http://jnas.nbuv.gov.ua/article/UJRN-0000734006 Article
institution	Library portal of National Academy of Sciences of Ukraine \| LibNAS
collection	Open-Science
language	English
series	Journal of thermoelectricity
spellingShingle	Journal of thermoelectricity V. P. Shafranyuk Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
format	Article
author	V. P. Shafranyuk
author_facet	V. P. Shafranyuk
author_sort	V. P. Shafranyuk
title	Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_short	Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_full	Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_fullStr	Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_full_unstemmed	Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry
title_sort	study of damaged layer depth in thermoelectric materials by x-ray diffraction interferometry
publishDate	2016
url	http://jnas.nbuv.gov.ua/article/UJRN-0000734006
work_keys_str_mv	AT vpshafranyuk studyofdamagedlayerdepthinthermoelectricmaterialsbyxraydiffractioninterferometry
first_indexed	2025-07-17T23:06:59Z
last_indexed	2025-07-17T23:06:59Z
_version_	1837937664027787264

Study of damaged layer depth in thermoelectric materials by X-ray diffraction interferometry

Репозитарії

Схожі ресурси