APA-Zitierstil (7. Ausg.)

Rozouvan, T. S., Poperenko, L. V., & Shaykevich, I. A. (2015). Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique.

Chicago-Zitierstil (17. Ausg.)

Rozouvan, T. S., L. V. Poperenko, und I. A. Shaykevich. Influence of the Surface Roughness and Oxide Surface Layer onto Si Optical Constants Measured by the Ellipsometry Technique. 2015.

MLA-Zitierstil (8. Ausg.)

Rozouvan, T. S., et al. Influence of the Surface Roughness and Oxide Surface Layer onto Si Optical Constants Measured by the Ellipsometry Technique. 2015.