APA (7th ed.) Citation

Rozouvan, T. S., Poperenko, L. V., & Shaykevich, I. A. (2015). Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique.

Chicago Style (17th ed.) Citation

Rozouvan, T. S., L. V. Poperenko, and I. A. Shaykevich. Influence of the Surface Roughness and Oxide Surface Layer onto Si Optical Constants Measured by the Ellipsometry Technique. 2015.

MLA (8th ed.) Citation

Rozouvan, T. S., et al. Influence of the Surface Roughness and Oxide Surface Layer onto Si Optical Constants Measured by the Ellipsometry Technique. 2015.