Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors
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| Date: | 2015 |
|---|---|
| Main Authors: | , , , |
| Format: | Article |
| Language: | English |
| Published: |
2015
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| Series: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000706499 |
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| Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
open-sciencenbuvgovua-65499 |
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open-sciencenbuvgovua-654992024-04-16T13:18:28Z Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors V. S. Slipokurov M. N. Dub A. K. Tkachenko Ya. Ya. Kudryk 1560-8034 2015 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000706499 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Semiconductor Physics, Quantum Electronics and Optoelectronics |
| spellingShingle |
Semiconductor Physics, Quantum Electronics and Optoelectronics V. S. Slipokurov M. N. Dub A. K. Tkachenko Ya. Ya. Kudryk Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| format |
Article |
| author |
V. S. Slipokurov M. N. Dub A. K. Tkachenko Ya. Ya. Kudryk |
| author_facet |
V. S. Slipokurov M. N. Dub A. K. Tkachenko Ya. Ya. Kudryk |
| author_sort |
V. S. Slipokurov |
| title |
Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| title_short |
Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| title_full |
Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| title_fullStr |
Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| title_full_unstemmed |
Methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| title_sort |
methodological aspects of measuring the resistivity of contacts to high-resistance semiconductors |
| publishDate |
2015 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0000706499 |
| work_keys_str_mv |
AT vsslipokurov methodologicalaspectsofmeasuringtheresistivityofcontactstohighresistancesemiconductors AT mndub methodologicalaspectsofmeasuringtheresistivityofcontactstohighresistancesemiconductors AT aktkachenko methodologicalaspectsofmeasuringtheresistivityofcontactstohighresistancesemiconductors AT yayakudryk methodologicalaspectsofmeasuringtheresistivityofcontactstohighresistancesemiconductors |
| first_indexed |
2025-07-22T05:01:11Z |
| last_indexed |
2025-07-22T05:01:11Z |
| _version_ |
1838322586371489792 |