APA (7th ed.) Citation

Yefremov, O. O., Lytovchenko, V. H., Melnyk, V. P., Oberemok, O. S., Popov, V. H., & Romaniuk, B. M. (2015). Dopant depth profile modification during mass Spectrometric analysis of multilayer nanostructures.

Chicago Style (17th ed.) Citation

Yefremov, O. O., V. H. Lytovchenko, V. P. Melnyk, O. S. Oberemok, V. H. Popov, and B. M. Romaniuk. Dopant Depth Profile Modification During Mass Spectrometric Analysis of Multilayer Nanostructures. 2015.

MLA (8th ed.) Citation

Yefremov, O. O., et al. Dopant Depth Profile Modification During Mass Spectrometric Analysis of Multilayer Nanostructures. 2015.