Al-Adamat, K. M., & El-Nasser, H. M. (2021). Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry.
Chicago Style (17th ed.) CitationAl-Adamat, K. M., and H. M. El-Nasser. Characterization of Cobalt Phthalocyanine Thin Film on Silicon Substrate Using Spectroscopic Ellipsometry. 2021.
MLA (8th ed.) CitationAl-Adamat, K. M., and H. M. El-Nasser. Characterization of Cobalt Phthalocyanine Thin Film on Silicon Substrate Using Spectroscopic Ellipsometry. 2021.
Warning: These citations may not always be 100% accurate.