Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
Saved in:
Date: | 2021 |
---|---|
Main Authors: | K. M. Al-Adamat, H. M. El-Nasser |
Format: | Article |
Language: | English |
Published: |
2021
|
Series: | Ukrainian Journal of Physics |
Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0001276626 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNASSimilar Items
-
Characterization of Cobalt phthalocyanine thin film on silicon substrate using spectroscopic ellipsometry
by: K. M. Al-Adamat, et al.
Published: (2021) -
Optical characterization of thin Au films by standard and polaritonic ellipsometry
by: Dmitruk, N.L., et al.
Published: (2003) -
Origin of surface layer on common substrates for functional material films probed by ellipsometry
by: Belyaeva, A.I., et al.
Published: (2003) -
Magnetic anisotropy in Fe phthalocyanine film deposited on Si(110) substrate: standing configuration
by: Bartolomé, J., et al.
Published: (2017) -
Magnetic anisotropy in Fe phthalocyanine film deposited on Si(110) substrate: standing configuration
by: J. Bartolomй, et al.
Published: (2017)