Ellipsometric Properties of Thin Films of Molybdenum at the Excitation of Surface Polaritons
Saved in:
Date: | 2014 |
---|---|
Main Authors: | V. V. Lendel, O. V. Lomakina, Yu. Melnychenko, I. A. Shaikevych |
Format: | Article |
Language: | English |
Published: |
2014
|
Series: | Metallophysics and advanced technologies |
Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000525687 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Institution
Library portal of National Academy of Sciences of Ukraine | LibNASSimilar Items
-
Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation
by: Shybiko, Ya.A., et al.
Published: (2006) -
Optical properties of thin films of titanium with transient layers on them
by: V. V. Lendel, et al.
Published: (2010) -
Optical properties of thin films of titanium with transient layers on them
by: Lendel, V.V., et al.
Published: (2010) -
Surface polariton excitation in ZnO films deposited using ALD
by: E. F. Venger, et al.
Published: (2015) -
Surface polariton excitation in ZnO films deposited using ALD
by: Venger, E.F., et al.
Published: (2015)