Sachenko, A. V., Kostylev, V. P., Litovchenko, V. G., Popov, V. G., Romanyuk, B. M., Chernenko, V. V., . . . Komarov, F. F. (2013). Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer.
Chicago-Zitierstil (17. Ausg.)Sachenko, A. V., et al. Recombination Characteristics of Single-crystalline Silicon Wafers with a Damaged Near-surface Layer. 2013.
MLA-Zitierstil (8. Ausg.)Sachenko, A. V., et al. Recombination Characteristics of Single-crystalline Silicon Wafers with a Damaged Near-surface Layer. 2013.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.