Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
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| Datum: | 2013 |
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| Hauptverfasser: | , , , , , , , , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
2013
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| Schriftenreihe: | Ukrainian journal of physics |
| Online Zugang: | http://jnas.nbuv.gov.ua/article/UJRN-0000688686 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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open-sciencenbuvgovua-870792024-04-16T18:55:30Z Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer A. V. Sachenko V. P. Kostylev V. G. Litovchenko V. G. Popov B. M. Romanyuk V. V. Chernenko V. M. Naseka T. V. Slusar S. I. Kyrylova F. F. Komarov 2071-0186 2013 en Ukrainian journal of physics http://jnas.nbuv.gov.ua/article/UJRN-0000688686 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Ukrainian journal of physics |
| spellingShingle |
Ukrainian journal of physics A. V. Sachenko V. P. Kostylev V. G. Litovchenko V. G. Popov B. M. Romanyuk V. V. Chernenko V. M. Naseka T. V. Slusar S. I. Kyrylova F. F. Komarov Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| format |
Article |
| author |
A. V. Sachenko V. P. Kostylev V. G. Litovchenko V. G. Popov B. M. Romanyuk V. V. Chernenko V. M. Naseka T. V. Slusar S. I. Kyrylova F. F. Komarov |
| author_facet |
A. V. Sachenko V. P. Kostylev V. G. Litovchenko V. G. Popov B. M. Romanyuk V. V. Chernenko V. M. Naseka T. V. Slusar S. I. Kyrylova F. F. Komarov |
| author_sort |
A. V. Sachenko |
| title |
Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| title_short |
Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| title_full |
Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| title_fullStr |
Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| title_full_unstemmed |
Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| title_sort |
recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer |
| publishDate |
2013 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0000688686 |
| work_keys_str_mv |
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| first_indexed |
2025-07-22T11:10:16Z |
| last_indexed |
2025-07-22T11:10:16Z |
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