Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin

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Datum:2013
Hauptverfasser: R. M. Rudenko, V. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, A. M. Kraichynskyi, V. O. Yukhymchuk, V. A. Makara
Format: Artikel
Sprache:English
Veröffentlicht: 2013
Schriftenreihe:Ukrainian Journal of Physics
Online Zugang:http://jnas.nbuv.gov.ua/article/UJRN-0000725577
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spelling open-sciencenbuvgovua-873722024-04-16T18:57:48Z Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin R. M. Rudenko V. V. Voitovych M. M. Krasko A. H. Kolosiuk A. M. Kraichynskyi V. O. Yukhymchuk V. A. Makara 0372-400X 2013 en Ukrainian Journal of Physics http://jnas.nbuv.gov.ua/article/UJRN-0000725577 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Ukrainian Journal of Physics
spellingShingle Ukrainian Journal of Physics
R. M. Rudenko
V. V. Voitovych
M. M. Krasko
A. H. Kolosiuk
A. M. Kraichynskyi
V. O. Yukhymchuk
V. A. Makara
Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin
format Article
author R. M. Rudenko
V. V. Voitovych
M. M. Krasko
A. H. Kolosiuk
A. M. Kraichynskyi
V. O. Yukhymchuk
V. A. Makara
author_facet R. M. Rudenko
V. V. Voitovych
M. M. Krasko
A. H. Kolosiuk
A. M. Kraichynskyi
V. O. Yukhymchuk
V. A. Makara
author_sort R. M. Rudenko
title Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin
title_short Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin
title_full Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin
title_fullStr Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin
title_full_unstemmed Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin
title_sort influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin
publishDate 2013
url http://jnas.nbuv.gov.ua/article/UJRN-0000725577
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AT voyukhymchuk influenceofhightemperatureannealingonthestructureandtheintrinsicabsorptionedgeofthinfilmsilicondopedwithtin
AT vamakara influenceofhightemperatureannealingonthestructureandtheintrinsicabsorptionedgeofthinfilmsilicondopedwithtin
first_indexed 2025-07-22T11:17:03Z
last_indexed 2025-07-22T11:17:03Z
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