Influence of high temperature annealing on the structure and the intrinsic absorption edge of thin-film silicon doped with tin
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Date: | 2013 |
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Main Authors: | R. M. Rudenko, V. V. Voitovych, M. M. Krasko, A. H. Kolosiuk, A. M. Kraichynskyi, V. O. Yukhymchuk, V. A. Makara |
Format: | Article |
Language: | English |
Published: |
2013
|
Series: | Ukrainian Journal of Physics |
Online Access: | http://jnas.nbuv.gov.ua/article/UJRN-0000725577 |
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Journal Title: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
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