Gomeniuk, Y. V. (2012). Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements.
Chicago-Zitierstil (17. Ausg.)Gomeniuk, Yu. V. Determination of Interface State Density in High-k Dielectric-silicon System from Conductance-frequency Measurements. 2012.
MLA-Zitierstil (8. Ausg.)Gomeniuk, Yu. V. Determination of Interface State Density in High-k Dielectric-silicon System from Conductance-frequency Measurements. 2012.
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