APA (7th ed.) Citation

Gomeniuk, Y. V. (2012). Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements.

Chicago Style (17th ed.) Citation

Gomeniuk, Yu. V. Determination of Interface State Density in High-k Dielectric-silicon System from Conductance-frequency Measurements. 2012.

MLA (8th ed.) Citation

Gomeniuk, Yu. V. Determination of Interface State Density in High-k Dielectric-silicon System from Conductance-frequency Measurements. 2012.

Warning: These citations may not always be 100% accurate.