Schottky contact degradation at thermal annealing

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Bibliographic Details
Date:2012
Main Authors: E. F. Venger, I. Gotovy, L. V. Shekhovtsov
Format: Article
Language:English
Published: 2012
Series:Optoelectronics and Semiconductor Technique
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0001287281
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Journal Title:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS