Amer, H. H., Elkordy, M., Zien, M., Dahshan, A., & Elshamy, R. A. (2011). Characterization of quaternary chalcogenide As-Ge-Te-Si thin films.
Chicago Style (17th ed.) CitationAmer, H. H., M. Elkordy, M. Zien, A. Dahshan, and R. A. Elshamy. Characterization of Quaternary Chalcogenide As-Ge-Te-Si Thin Films. 2011.
MLA (8th ed.) CitationAmer, H. H., et al. Characterization of Quaternary Chalcogenide As-Ge-Te-Si Thin Films. 2011.
Warning: These citations may not always be 100% accurate.