Спектроскопія у зазорі: фаза відбитої хвилі і характеризація плівок
Optical methods that are used to characterize the state of a surface covered with films are based on the measurement of either the ratio between the complex reflection coefficients for mutually orthogonal light polarizations (ellipsometry) or the magnitudes of reflection coefficients themselves; aft...
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| Date: | 2018 |
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| Main Author: | |
| Format: | Article |
| Language: | Ukrainian English |
| Published: |
Publishing house "Academperiodika"
2018
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| Subjects: | |
| Online Access: | https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018592 |
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| Journal Title: | Ukrainian Journal of Physics |