Low-frequency noise in nFinFETs of different dimensions processed in strained and non-strained SOI wafers

by Lukyanchikova, N., Garbar, N., Kudina, V., Smolanka, A., Simoen, E., Claeys, C.
Published 2008

Microfluctuations of oxygen impurity concentration as a reason of accelerated oxygen diffusion in silicon

by Neimash, V.B., Puzenko, O.O., Kraitchinskii, A.M., Krasko, M.M., Putselyk, S., Claeys, C., Simoen, E.
Published 2000