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Fochuk, P.M.
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Fochuk, P.M.
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Fochuk, P.M.
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Si as dopant impurity in CdTe
by
Fochuk, P.M.
,
Panchuk, O.E.
Published 2005
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2
Thermodynamic analysis of processes creating the defects in cadmium telluride crystals under conditions of high-temperature annealing
by
Prokopiv, V.V.
,
Fochuk, P.M.
,
Gorichok, I.V.
,
Vergak, E.V.
Published 2009
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3
Structural and microstructural properties of Cd₁-xZnxTe films deposited by close spaced vacuum sublimation
by
Znamenshchykov, Y.V.
,
Kosyak, V.V.
,
Opanasyuk, A.S.
,
Kolesnyk, M.M.
,
Grinenko, V.V.
,
Fochuk, P.M.
Published 2016
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4
Характеристика наноструктурованих включень In6Se7 у шаруватих кристалах α-In2Se3 аналітичними методами рентгенівської дифрактометрії...
by
Drapak, S.I.
,
Gavrylyuk, S.V.
,
Khalavka, Y.B.
,
Fotiy, V.D.
,
Fochuk, P.M.
,
Fediv, O.I.
Published 2022
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Related Subjects
Characterization and properties
analytical X-ray diffractometry methods
composites
layered In2Se3 crystals
microstructure
nanocrystallite inclusions
аналiтичнi методи рентгенiвської дифрактометрiї
включення нанокристалiтiв
композити
мiкроструктура
шаруватi кристали In2Se3