Determination of surface parameters of solids by methods of X-ray total external reflection

за авторством Balovsyak, S.V., Fodchuk, I.M., Lytvyn, P.M.
Опубліковано 2003

Character of elastic energy absorption in well developed genetic-impurity defect structure in monocrystalline silicon

за авторством Gutsulyak, B.I., Oliynych-Lysyuk, A.V., Fodchuk, I.M.
Опубліковано 2005

Solid state doping of CdxHg₁₋xTe epitaxial layers with elements of V group

за авторством Vlasov, A.P., Bonchyk, A.Yu., Fodchuk, I.M., Barcz, A., Swiatek, Z.T., Zaplitnyy, R.A.
Опубліковано 2006

Evolution of defective structure of the irradiated silicon during natural ageing

за авторством Fodchuk, I.M., Gutsulyak, T.G., Himchynsky, O.G., Olijnich-Lysjuk, A.V., Raransky, N.D.
Опубліковано 2003

Structural changes in multilayer systems containing InxGa₁₋xAs₁₋yNy quantum wells

за авторством Fodchuk, I.M., Gevyk, V.B., Gimchinsky, O.G., Kislovskii, E.N., Kroytor, O.P., Molodkin, V.B., Olihovskii, S.I., Pavelescu, E.M., Pessa, M.
Опубліковано 2003

Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions

за авторством Fodchuk, I.M., Gutsuliak, I.I., Zaplitniy, R.A., Balovsyak, S.V., Yaremiy, I.P., Bonchyk, O.Yu., Savitskiy, G.V., Syvorotka, I.M., Lytvyn, P.M.
Опубліковано 2013

Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals

за авторством Molodkin, V.B., Olikhovskii, S.I., Len, E.G., Kyslovskyy, Ye.M., Reshetnyk, O.V., Vladimirova, T.P., Sheludchenko, B.V., Skakunova, E.S., Lizunov, V.V., Kochelab, E.V., Fodchuk, I.M., Klad’ko, V.P.
Опубліковано 2016