Determination of surface parameters of solids by methods of X-ray total external reflection

von Balovsyak, S.V., Fodchuk, I.M., Lytvyn, P.M.
Veröffentlicht 2003

Character of elastic energy absorption in well developed genetic-impurity defect structure in monocrystalline silicon

von Gutsulyak, B.I., Oliynych-Lysyuk, A.V., Fodchuk, I.M.
Veröffentlicht 2005

Solid state doping of CdxHg₁₋xTe epitaxial layers with elements of V group

von Vlasov, A.P., Bonchyk, A.Yu., Fodchuk, I.M., Barcz, A., Swiatek, Z.T., Zaplitnyy, R.A.
Veröffentlicht 2006

Evolution of defective structure of the irradiated silicon during natural ageing

von Fodchuk, I.M., Gutsulyak, T.G., Himchynsky, O.G., Olijnich-Lysjuk, A.V., Raransky, N.D.
Veröffentlicht 2003

Structural changes in multilayer systems containing InxGa₁₋xAs₁₋yNy quantum wells

von Fodchuk, I.M., Gevyk, V.B., Gimchinsky, O.G., Kislovskii, E.N., Kroytor, O.P., Molodkin, V.B., Olihovskii, S.I., Pavelescu, E.M., Pessa, M.
Veröffentlicht 2003

Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions

von Fodchuk, I.M., Gutsuliak, I.I., Zaplitniy, R.A., Balovsyak, S.V., Yaremiy, I.P., Bonchyk, O.Yu., Savitskiy, G.V., Syvorotka, I.M., Lytvyn, P.M.
Veröffentlicht 2013

Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals

von Molodkin, V.B., Olikhovskii, S.I., Len, E.G., Kyslovskyy, Ye.M., Reshetnyk, O.V., Vladimirova, T.P., Sheludchenko, B.V., Skakunova, E.S., Lizunov, V.V., Kochelab, E.V., Fodchuk, I.M., Klad’ko, V.P.
Veröffentlicht 2016