Structural changes in Cz-Si single crystals irradiated with high-energy electrons from data of high-resolution X-ray diffractometry

by Fodchuk, І.М., Dovganyuk, V.V., Litvinchuk, Т.V., Kladko, V.P., Slobodian, М.V., Gudymenko, O.Yo., Swiatek, Z.
Published 2010

Influence of deposition rate and substrate temperature on structure and optical features of NiO thin film

by Oberemok, O.S., Sabov, T.M., Lisovskyy, I.P., Khacevych, I.M., Gudymenko, O.Yo., Nikirin, V.A., Voitovych, M.V.
Published 2016

Особливості зародження та упорядкування GeSi наноострівців у багатошарових структурах, сформованих на Si та Si1-xGex буферних шарах...

by Yukhymchuk, V.O., Valakh, M.Ya., Kladko, V.P., Slobodian, M.V., Gudymenko, O.Yo., Krasilnik, Z.F., Novikov, A.V.
Published 2022

Formation of silicon nanoclusters in buried ultra-thin oxide layers

by Oberemok, O.S., Litovchenko, V.G., Gamov, D.V., Popov, V.G., Melnik, V.P., Gudymenko, O.Yo., Nikirin, V.A., Khatsevich, І.M.
Published 2011

Influence of small miscuts on self-ordered growth of Ge nanoislands

by Gudymenko, O.Yo., Kladko, V.P., Yefanov, O.M., Slobodian, M.V., Polischuk, Yu.S., Krasilnik, Z.F., Lobanov, D.V., Novikov, А.А.
Published 2011