Investigation of the undersurface damaged layers in silicon wafers

за авторством Holiney, R.Yu., Matveeva, L.A., Venger, E.F.
Опубліковано 1999

Electron beam application for mechanical stress relaxation and for SI-SIO₂ interface structural regulation

за авторством Matveeva, L.A., Vanger, E.F., Holiney, R.Yu.
Опубліковано 1999

Electroreflectance spectroscopy and scanning electron microscopy study of microrelief silicon wafers with various surface pretreatments

за авторством Gorbach, T.Ya., Holiney, R.Yu., Matiyuk, I.M., Matveeva, L.A., Svechnikov, S.V., Venger, E.F.
Опубліковано 1998

Influence of neutron irradiation on elctrooptical and structural properties of silicon

за авторством Groza, A.A., Venger, E.F., Varnina, V.I., Holiney, R.Yu., Litovchenko, P.G., Matveeva, L.A., Litovchenko, A.P., Sugakov, V.I., Shmatko, G.G.
Опубліковано 2001