AES and XPS characterization of TiN layers formed and modified by ion implantation

by Melnik, V., Popov, V., Kruger, D., Oberemok, O.
Published 1999

Ultrasound effect on radiation damages in boron implanted silicon

by Romanjuk, B., Krüger, D., Melnik, V., Popov, V., Olikh, Ya., Soroka, V., Oberemok, O.
Published 2000