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Мiкроструктура тонких композитних плiвок Si–Sn
by
Neimash, V. B.
,
Poroshin, V. M.
,
Kabaldin, A. M.
,
Yukhymchuk, V. O.
,
Shepelyavyi, P. E.
,
Makara, V. A.
,
Larkin, S. Yu.
Published 2018
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Related Subjects
Auger method
Microstructure of thin composite films
Raman spectroscopy
мiкроструктура тонких композитних плiвок
метод Оже
метод раманiвської спектроскопiї