Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method

by Tkachenko, V.F., Kryvonogov, S.I., Budnikov, A.T., Lukienko, O.A., Vovk, E.A.
Published 2014

Structure perfection of sapphire single crystals grown by HOC method in reducing atmosphere

by Tkachenko, V.F., Lukienko, O.A., Budnikov, A.T., Vovk, E.A., Krivonogov, S.I.
Published 2011

Structure perfection of bulk and near-surface layers in sapphire single crystals

by Tkachenko, V.F., Puzikov, V.M., Dan`ko, A.Ya., Budnikov, A.T., Lukienko, O.A.
Published 2007

XRD studies of surface layers in sapphire substrates of <101Bar2> crystalloghaphic orientation

by Tkachenko, V.F., Lukienko, O.A., Budnikov, A.T., Vovk, E.A., Krivonogov, S.I., Dan`ko, A.Ya.
Published 2011

Study of nature of some defects visible in polarized light in sapphire signle crystals

by Tkachenko, V.F., Dan`ko, A.Ya., Puzikov, V.M., Budnikov, A.T., Lukienko, O.A., Sidelnikova, N.S., Adonkin, G.T.
Published 2007