Optical properties, form of granules and electronic parameters of binary Al/Cr composites

by Shaykevich, I.A., Kolesnyk, P.V.
Published 2000

Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique

by Rozouvan, T.S., Poperenko, L.V., Shaykevich, I.A.
Published 2015

Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation

by Shybiko, Ya.A., Shaykevich, I.A., Melnichenko, L.Yu.
Published 2006

Ellipsometric investigation of β-Si₃N₄ ceramics with Mo and Al additives

by Prokopets', V.M., Shaykevich, I.A., Robur, L.Y.
Published 2005

Optical properties of graphene film growing on a thin copper layer

by Rozouvan, T.S., Poperenko, L.V., Kravets, V.G., Shaykevich, I.A.
Published 2016

Influence of surface dimensional effects and interband transitions on absorption of light in aluminium

by Mеlnichenko, L.Yu., Tytarchuk, B.B., Shaykevich, I.A.
Published 2002

Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on surfaces of silicon photoelectric converters

by Donets, V.V., Melnichenko, L.Y., Shaykevich, I.A., Lomakina, O.V.
Published 2009

Optical properties of thin films of titanium with transient layers on them

by Lendel, V.V., Lomakina, O.V., Mel’nychenko, L.Yu., Shaykevich, I.A.
Published 2010