Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements

by Yu. V. Gomeniuk
Published 2012

Morphology and optical properties of tetragonal Ge nanoclusters grown on chemically oxidized Si(100) surfaces

by V. S. Lysenko, S. V. Kondratenko, Yu. N. Kozyrev, Yu. Rubezhanska, V. P. Kladko, Yu. V. Gomeniuk, O. Y. Gudymenko, Ye. Ye. Melnichuk, G. Grenet, N. B. Blanchard
Published 2012

Electroluminescent properties of Tb-doped carbon-enriched silicon oxide

by S. I. Tiagulskyi, A. N. Nazarov, S. O. Gordienko, A. V. Vasin, A. V. Rusavsky, T. M. Nazarova, Yu. V. Gomeniuk, V. S. Lysenko, L. Rebohle, M. Voelskow, W. Skorupa, Y. Koshka
Published 2014