Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements

von Yu. V. Gomeniuk
Veröffentlicht 2012

Morphology and optical properties of tetragonal Ge nanoclusters grown on chemically oxidized Si(100) surfaces

von V. S. Lysenko, S. V. Kondratenko, Yu. N. Kozyrev, Yu. Rubezhanska, V. P. Kladko, Yu. V. Gomeniuk, O. Y. Gudymenko, Ye. Ye. Melnichuk, G. Grenet, N. B. Blanchard
Veröffentlicht 2012

Electroluminescent properties of Tb-doped carbon-enriched silicon oxide

von S. I. Tiagulskyi, A. N. Nazarov, S. O. Gordienko, A. V. Vasin, A. V. Rusavsky, T. M. Nazarova, Yu. V. Gomeniuk, V. S. Lysenko, L. Rebohle, M. Voelskow, W. Skorupa, Y. Koshka
Veröffentlicht 2014