Experimental research of the problems of detecting bugs by means of nonlinear location

It is common knowledge that today information is the most important resource of the modern world. Active development of information technologies and their integration, determine the extremely important roles that they play in many spheres of human life. Important information of national importance s...

Повний опис

Збережено в:
Бібліографічні деталі
Дата:2018
Автори: Leontiev, V. O., Lyakhovchenko, N. V., Sinyuhin, V. V., Skutelnik, I. V., Pryimak, A. V.
Формат: Стаття
Мова:Ukrainian
Опубліковано: Інститут проблем реєстрації інформації НАН України 2018
Теми:
Онлайн доступ:http://drsp.ipri.kiev.ua/article/view/142904
Теги: Додати тег
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Назва журналу:Data Recording, Storage & Processing

Репозитарії

Data Recording, Storage & Processing
Опис
Резюме:It is common knowledge that today information is the most important resource of the modern world. Active development of information technologies and their integration, determine the extremely important roles that they play in many spheres of human life. Important information of national importance should be protected from unauthorized interception and the special importance in the issue of information security is the problem of information leakage through the mortgage devices. The problem lies in the fact that such devices for data capture can use most of the existing leakage channels. However, bookmarks are often used to intercept acoustic (linguistic) and specific information. Therefore, knowledge of the structural and technical features of the construction and functioning of hardware bookmarks is necessary to identify their strengths and weaknesses and to choose the optimal method of counteraction. The experimental researches of problems of detection of the mortgaged devices by a nonlinear locator are carried out. Laboratory studies were carried out using different semiconductor elements with different lengths of legs. The obtained results have shown that the length of the legs of semiconductor elements affects their detection.