The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series
The development of the device to measure the lifetime of ZnS luminescent films with different dopants has been presented. The devices have been designed to operate under semiautomatic ( LMS 01) and program mode (LMS 02) of measuring the parameters of films with setting the input ones. The data are...
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Datum: | 2003 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2003
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Schriftenreihe: | Semiconductor Physics Quantum Electronics & Optoelectronics |
Online Zugang: | http://dspace.nbuv.gov.ua/handle/123456789/118093 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Zitieren: | The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series / K. Popovych, Yu. Nakonechny, I. Rubish, V. Gerasimov, G. Leising // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 520-523. — Бібліогр.: 4 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of UkraineZusammenfassung: | The development of the device to measure the lifetime of ZnS luminescent films with different dopants has been presented. The devices have been designed to operate under semiautomatic ( LMS 01) and program mode (LMS 02) of measuring the parameters of films with
setting the input ones. The data are transmitted to a computer and processed by a specialized program that, in its turn, controls the operation of the device, on the whole. |
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