Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vo...
Gespeichert in:
| Datum: | 2004 |
|---|---|
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2004
|
| Schriftenreihe: | Физика низких температур |
| Schlagworte: | |
| Online Zugang: | http://dspace.nbuv.gov.ua/handle/123456789/119474 |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ. |