Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions

Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions

We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vo...

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Bibliographic Details
Date:2004
Main Authors: Ivanov, Z.G., Fogel, N.Ya., Yuzephovich, O.I., Stepantsov, E.A., Tzalenchuk, A.Ya.
Format: Article
Language:English
Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2004
Series:Физика низких температур
Subjects:
Свеpхпpоводимость, в том числе высокотемпеpатуpная
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/119474
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine

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