Radiological characterization of metal oxide semiconductor field effect transistor dosimeter

This paper reports our effort to develop a detailed 3D Monte Carlo simulation model of the High-Sensitivity MOSFET dosimeter using the MCNP 4C code for radiological charac -terization. To determine the dosimeter response accurately, this study has taken three actions: (1) The absorbed dose to the se...

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Bibliographic Details
Date:2004
Main Authors: Chan-Hyeong Kim, Sang-Hoon Lee, Baodong Wang, X.George Xu
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2004
Series:Functional Materials
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/135238
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Radiological characterization of metal oxide semiconductor field effect transistor dosimeter / Chan-Hyeong Kim, Sang-Hoon Lee, Baodong Wang, X.George Xu // Functional Materials. — 2004. — Т. 11, № 1. — С. 183-185. — Бібліогр.: 4 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine