Absorption edge of nanocrystalline cubic silicon carbide films

The optical absorption edge of nanocrystalline films of cubic silicon carbide polytype (nc-SlC) obtained by direct ion deposition have been studied using optical spectroscopy. Within the 1.12-6.5 eV, three optical absorption regions have been found with different (exponential, power, and oscillating...

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Bibliographic Details
Date:2009
Main Authors: Lopin, A.V., Semenov, A.V., Puzikov, V.M., Skorik, S.N.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2009
Series:Functional Materials
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Online Access:http://dspace.nbuv.gov.ua/handle/123456789/136626
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Absorption edge of nanocrystalline cubic silicon carbide films // A.V. Lopin, A.V. Semenov, V.M. Puzikov, S.N. Skorik // Functional Materials. — 2009. — Т. 16, № 1. — С. 36-40. — Бібліогр.: 20 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine