TMR, MRE, and X-ray photoelectron spectroscopy of Fe-SiO₂ granular films
Feₓ(Si0₂)₁₋ₓ magnetic granular films below the percolation threshold (х < 0.45) have been studied using tunneling magnetoresistance (TMR), magnetorefractive effect (MRE), and X-ray photoelectron spectroscopy. Maximum magnetoresistance ratio of 3.7 % at room temperature was observed for...
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| Datum: | 2005 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
НТК «Інститут монокристалів» НАН України
2005
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| Schriftenreihe: | Functional Materials |
| Online Zugang: | http://dspace.nbuv.gov.ua/handle/123456789/137251 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | TMR, MRE, and X-ray photoelectron spectroscopy of Fe-SiO₂ granular films / V.G. Kravets, L.V. Poperenko, K.L. Vinnichenko // Functional Materials. — 2005. — Т. 12, № 2. — С. 328-333. — Бібліогр.: 14 назв. — англ. |