Crystallization process in thin stoichiometric GeSbTe films

The crystallization kinetics of Ge₁Sb₂Тe₄ and Ge₂Sb₂Тe₅ films has been analyzed using results of impedance measurements, in which Bruggerman's effective medium approximation was employed, considering that the amorphous matrix contained inclusions of two different crystalline phases. To vali...

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Datum:2005
Hauptverfasser: Claudio, D., Laine, B., Licea, O., Morales-Sanchez, E., Prokhorov, E., Trapaga, G.
Format: Artikel
Sprache:English
Veröffentlicht: НТК «Інститут монокристалів» НАН України 2005
Schriftenreihe:Functional Materials
Online Zugang:http://dspace.nbuv.gov.ua/handle/123456789/138877
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Crystallization process in thin stoichiometric GeSbTe films / D. Claudio, B. Laine, O. Licea, E. Morales-Sanchez, E. Prokhorov, G. Trapaga // Functional Materials. — 2005. — Т. 12, № 4. — С. 669-673. — Бібліогр.: 13 назв. — англ.

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