Ellipsometric plasmon sensor for adsorbed layers on thin Ag and Au films
Using Kretschmann’s method, important parameters defining the propagation of surface waves (namely, the restored polarization azimuth ψ and phase difference Δ between p- and s-components of the electromagnetic wave) versus the light incidence angle θ for thin Ag and Au films have been investigated....
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| Date: | 2005 |
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| Main Authors: | , , |
| Format: | Article |
| Language: | English |
| Published: |
НТК «Інститут монокристалів» НАН України
2005
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| Series: | Functional Materials |
| Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/139715 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Ellipsometric plasmon sensor for adsorbed layers on thin Ag and Au films / V.L. Severynov, I.A. Shaikevich, Y.A. Shybiko // Functional Materials. — 2005. — Т. 12, № 1. — С. 131-132. — Бібліогр.: 4 назв. — англ. |