Structural features of doped silicon single crystals

The nature of the change in the Fermi level of silicon under the influence of dopants, point defects, and dislocations has been determined. The parameters of the diffusion of impurities, the conditions for their appearance and removal in the process of directional crystallization and the post-crysta...

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Bibliographic Details
Date:2022
Main Authors: Azarenkov, N.A., Semenenko, V.E., Stervoyedov, N.G.
Format: Article
Language:English
Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2022
Series:Вопросы атомной науки и техники
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Online Access:http://dspace.nbuv.gov.ua/handle/123456789/195817
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Structural features of doped silicon single crystals / N.A. Azarenkov, V.E. Semenenko, N.G. Stervoyedov // Problems of Atomic Science and Technology. — 2022. — № 1. — С. 26-31. — Бібліогр.: 16 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine