Investigation the structured material surfaces using the quartz tuning fork based on an atomic force microscopy with controllable q-factor in two modes operation: “intermittent contact” and “shear-force”
We present a combination of an atomic force microscopy with a quartz-crystal tuning fork in ambient conditions. A silicon cantilever tip was attached to one prong of the tuning fork to realize shear-force and intermittent contact mode Fork-AFM operation. By electronically adjusting the quality facto...
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| Datum: | 2008 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Науковий фізико-технологічний центр МОН та НАН України
2008
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| Online Zugang: | http://dspace.nbuv.gov.ua/handle/123456789/7881 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Investigation the structured material surfaces using the quartz tuning fork based on an atomic force microscopy with controllable q-factor in two modes operation: “intermittent contact” and “shear-force” / Vo Thanh Tung, S.A. Chizhik, V.V. Chikunov, Tran Xuan Hoai // Физическая инженерия поверхности. — 2008. — Т. 6, № 3-4. — С. 210-215. — Бібліогр.: 20 назв. — англ. |