Formation of thin film Cr-N composites under ion bombardment at low rates of chromium deposition

One of peculiar features of the IBAD technology consists in that the damage level and concentration of implanted ions are distributed nonuniformly in the depth of deposited material. The calculations, we have done earlier [1], showed that the highest degree of nonequilibrium is realized in the f...

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Bibliographic Details
Date:2006
Main Authors: Guglya, A., Litvinenko, M., Marchenko, Y., Vasilenko, R.
Format: Article
Language:English
Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2006
Series:Вопросы атомной науки и техники
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Online Access:http://dspace.nbuv.gov.ua/handle/123456789/80341
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Formation of thin film Cr-N composites under ion bombardment at low rates of chromium deposition / A. Guglya, M. Litvinenko, Y. Marchenko, R. Vasilenko // Вопросы атомной науки и техники. — 2006. — № 4. — С. 200-203. — Бібліогр.: 9 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine