Control complex for a double-sided microstrip detector production and tests

Control complex for a double-sided microstrip detector production and tests

The controlling system for detector silicon and for a double-sided microstrip detectors (DSMD) characteristics tests is described.

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Bibliographic Details
Date:2000
Main Authors: Kaplij, A.A., Kulibaba, V.I., Kuijer, P., Maslov, N.I., Ovchinnik, V.D., Potin, S.M., Starodubtsev, A.F.
Format: Article
Language:English
Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2000
Series:Вопросы атомной науки и техники
Subjects:
Еxperimental methods
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/82268
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Control complex for a double-sided microstrip detector production and tests / A.A. Kaplij, V.I. Kulibaba, P. Kuijer, N.I. Maslov, V.D. Ovchinnik, S.M. Potin, A.F. Starodubtsev // Вопросы атомной науки и техники. — 2000. — № 2. — С. 41-45. — Бібліогр.: 5 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine

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