Absorption edge of nanocrystalline cubic silicon carbide films
The optical absorption edge of nanocrystalline films of cubic silicon carbide polytype (nc-SlC) obtained by direct ion deposition have been studied using optical spectroscopy. Within the 1.12-6.5 eV, three optical absorption regions have been found with different (exponential, power, and oscillating...
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| Date: | 2009 |
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| Main Authors: | , , , |
| Format: | Article |
| Language: | English |
| Published: |
НТК «Інститут монокристалів» НАН України
2009
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| Series: | Functional Materials |
| Subjects: | |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Absorption edge of nanocrystalline cubic silicon carbide films // A.V. Lopin, A.V. Semenov, V.M. Puzikov, S.N. Skorik // Functional Materials. — 2009. — Т. 16, № 1. — С. 36-40. — Бібліогр.: 20 назв. — англ. |