Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy
The nanostructured silicon surface has been studied using the scanning tunnel microscopy and spectroscopy in air. The local density of electron states was defined as normalized differential tunnel conductivity (dI/dU)(I/U). The surface morphology has been found to be characterized by the presence of...
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| Datum: | 2008 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
НТК «Інститут монокристалів» НАН України
2008
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| Schriftenreihe: | Functional Materials |
| Schlagworte: | |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy / S.P. Kulyk, M.M. Melnichenko, K.V. Svezhentsova, O.M. Shmyryova // Functional Materials. — 2008. — Т. 15, № 1. — С. 74-77. — Бібліогр.: 6 назв. — англ. |