APA (7th ed.) Citation

Kulyk, S., Melnichenko, M., Svezhentsova, K., & Shmyryova, O. (2008). Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy. НТК «Інститут монокристалів» НАН України.

Chicago Style (17th ed.) Citation

Kulyk, S.P, M.M Melnichenko, K.V Svezhentsova, and O.M Shmyryova. Study of Nanostructured Layers of Single-crystal Silicon by Scanning Tunnel Spectroscopy. НТК «Інститут монокристалів» НАН України, 2008.

MLA (8th ed.) Citation

Kulyk, S.P, et al. Study of Nanostructured Layers of Single-crystal Silicon by Scanning Tunnel Spectroscopy. НТК «Інститут монокристалів» НАН України, 2008.